The SHI irradiation induced transition to negative dielectric constant phase in K2Bi4Ti4WO18

In present communication, a new Aurivillius family compound K 2 Bi 4 Ti WO 18 was synthesized, and the impact of swift heavy ion (SHI), Ni +11 irradiation on its surface dielectric properties has been studied in detail. The phase formation this complex oxide, crystallization to B2cb symmetry confirmed by X-ray diffraction. However, post XRD, SEM AFM studies shows amorphization, agreement with theoretical calculations. Furthermore, effect also observed bulk as system transform negative constant above 350 radio frequencies. This transition is correlation significant change other parameters such enhancement AC conductivity, helical Nyquist plot multiple relaxations. conspicuous changes response attributed SHI induced defect formation, modification energy barriers their consequences electronic structure. Thus, current study suggests that could be tailored opens possibility tuning functional properties.